Table of Contents
Overview#
LCD pixel circuits must maintain voltage between refresh cycles. The storage capacitor configuration significantly impacts display performance.
Basic Pixel Circuit#
Gate Line (Gi) ──┬──[TFT]──┬── Data Line (Dj)
│ │
═╪═ ═╪═
═╪═ Cst ═╪═ Clc
═╪═ ═╪═
│ │
Common ──────┘Components#
| Component | Function |
|---|---|
| TFT | Switch (on/off control) |
| Clc | Liquid crystal capacitance |
| Cst | Storage capacitor |
Storage Capacitor Configurations#
Configuration 1: Storage on Common (Cs on Com)#
Gate (Gi) ────[TFT]───┬──── Data (Dj)
│
═╪═ Clc
═╪═
│
═╪═ Cst
═╪═
│
Common (Vcom)Characteristics:
- Capacitor between pixel electrode and common line
- Simpler structure
- Independent of gate timing
Configuration 2: Storage on Gate (Cs on Gate)#
Gate (Gi) ────[TFT]───┬──── Data (Dj)
│
═╪═ Clc
═╪═
│
═╪═ Cst
═╪═
│
Gate (Gi-1) ← Previous rowCharacteristics:
- Capacitor connected to previous row’s gate line
- More compact design
- Potential coupling effects
Voltage Coupling Issue#
Problem with Cs on Gate#
When data is written to row i:
- Gate line Gi is high (TFT on)
- Data voltage applied to pixel
- Storage capacitor couples to Gi-1
This can cause voltage fluctuations:
$$ \Delta V_{pixel} = \frac{C_{st}}{C_{st} + C_{lc}} \cdot \Delta V_{gate} $$Impact on Previous Row#
The coupling may cause:
- Slight gate voltage change on row i-1
- Minimal TFT conduction if \(V_{gs}\) approaches threshold
- Potential charge leakage
Why It’s Usually Acceptable#
Timing window is short
- Gate pulse duration: ~15 μs
- Coupling effect brief
Voltage change is small
- Capacitive divider reduces effect
- Typically < 0.1V change
TFT threshold margin
- Gate off voltage is well below threshold
- Small perturbation doesn’t turn on TFT
TFT Leakage Considerations#
Off-State Leakage#
TFT gates cannot achieve perfect closure when \(V_{ds}\) exists:
$$ I_{off} = I_0 \cdot e^{(V_{gs} - V_{th})/S} $$Where S is subthreshold slope.
Permissible Leakage#
The acceptable leakage current relates to perceptible luminance changes:
$$ \Delta V = \frac{I_{leak} \cdot t_{frame}}{C_{total}} $$If \(\Delta V\) causes < 1% brightness change, it’s imperceptible.
Design Margins#
| Parameter | Typical Value |
|---|---|
| Off-state leakage | < 1 pA |
| Frame time | 16.7 ms (60 Hz) |
| Storage capacitance | 0.3-0.5 pF |
| Acceptable ΔV | < 50 mV |
Capacitance Requirements#
Total Pixel Capacitance#
$$ C_{total} = C_{lc} + C_{st} + C_{parasitic} $$Sizing Guidelines#
$$ C_{st} \approx (2-3) \times C_{lc} $$Larger storage capacitor:
- Better voltage retention
- Reduced aperture ratio
Trade-offs#
| Larger Cst | Smaller Cst |
|---|---|
| Better holding | More droop |
| Slower charging | Faster charging |
| Lower aperture | Higher aperture |
Feedthrough Voltage#
Kickback Effect#
When gate turns off:
$$ \Delta V_{pixel} = \frac{C_{gs}}{C_{gs} + C_{lc} + C_{st}} \cdot \Delta V_{gate} $$This shifts pixel voltage, requiring compensation.
Compensation Methods#
- Vcom adjustment: Shift common voltage
- Data adjustment: Pre-compensate data voltage
- Layout optimization: Minimize gate-source overlap
Advanced Pixel Designs#
Dual TFT#
Gate ────[TFT1]──┬──[TFT2]──── Data
│
PixelReduces kickback and leakage.
Compensation Capacitor#
Additional capacitor for feedthrough correction:
┌─── Cst ───┐
Gate ─[TFT]─┤ ├─ Data
└─── Clc ───┘
└─── Cc ────┘ CompensationSummary#
| Configuration | Pros | Cons |
|---|---|---|
| Cs on Com | No coupling, simpler | More space needed |
| Cs on Gate | Compact, higher Cst | Potential coupling |
Design choice depends on:
- Display size and resolution
- Manufacturing process
- Performance requirements