Table of Contents

Overview
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In analog circuit design, achieving low noise typically requires larger device sizes and more area. This analysis explores the fundamental relationship between circuit area and noise performance.

Noise Fundamentals
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Thermal Noise
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Random motion of charge carriers:

$$ \overline{v_n^2} = 4kTR\Delta f $$

Or in spectral density:

$$ S_v(f) = 4kTR \quad [V^2/Hz] $$

Where:

  • \(k\): Boltzmann constant (\(1.38 \times 10^{-23}\) J/K)
  • \(T\): Temperature (K)
  • \(R\): Resistance (Ω)
  • \(\Delta f\): Bandwidth (Hz)

MOSFET Thermal Noise
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Channel thermal noise:

$$ \overline{i_n^2} = 4kT\gamma g_m \Delta f $$

Where \(\gamma \approx 2/3\) for long-channel devices.

Input-referred:

$$ \overline{v_{n,in}^2} = \frac{4kT\gamma}{g_m}\Delta f $$

Flicker (1/f) Noise
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$$ \overline{v_n^2} = \frac{K_f}{C_{ox}WL} \cdot \frac{1}{f} \Delta f $$

Where \(K_f\) is a process-dependent constant.

The Area-Noise Trade-off
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Why Larger Area = Lower Noise
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For Thermal Noise:

$$ g_m = \mu C_{ox}\frac{W}{L}(V_{GS} - V_{th}) $$

Larger \(W\) → larger \(g_m\) → lower input-referred noise:

$$ \overline{v_{n,in}^2} \propto \frac{1}{g_m} \propto \frac{L}{W} $$

For Flicker Noise:

$$ \overline{v_n^2} \propto \frac{1}{WL} $$

Larger area directly reduces 1/f noise.

Quantitative Relationship
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Parameter2× Area4× Area
Thermal noise power0.5×0.25×
Flicker noise power0.5×0.25×
Noise voltage0.71×0.5×

To halve noise voltage, quadruple the area.

Noise Sources in Circuits
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Resistor Noise
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    ┌───[R]───┐
    │    ~    │  ← Thermal noise source
    └─────────┘
$$ \overline{v_n^2} = 4kTR $$

Trade-off: Lower R = less noise but more power or different gain.

MOSFET Noise Model
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         Drain
    ┌──────┼──────┐
    │      │      │
    │   ┌──┴──┐   │
    │   │ i_n │   │  Channel noise
    │   └──┬──┘   │
    │      │      │
Gate──────[gm·vgs]─────Source
    │             │
    │    ┌───┐    │
    │    │v_n│    │  Gate noise (1/f + thermal)
    │    └─┬─┘    │
    └──────┴──────┘

Input-Referred Noise
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For an amplifier with multiple noise sources:

$$ \overline{v_{n,total}^2} = \overline{v_{n1}^2} + \frac{\overline{v_{n2}^2}}{A_1^2} + \frac{\overline{v_{n3}^2}}{(A_1 A_2)^2} + ... $$

Key insight: First stage dominates → make it large and low-noise.

Design Strategies
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Sizing for Low Noise
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Input Transistor:

$$ W_{opt} = \sqrt{\frac{K_f}{4kT\gamma} \cdot \frac{1}{f_{corner}}} $$

Where \(f_{corner}\) is the 1/f corner frequency.

Practical Rule:

  • Large W for low thermal noise
  • Large WL for low 1/f noise

Current Density Optimization
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For minimum noise figure:

$$ g_m = \sqrt{\omega^2 C_{gs}^2 + \omega^2 C_{gd}^2} $$

Optimal bias current:

$$ I_{D,opt} \propto \sqrt{f} $$

Noise-Efficient Design
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Noise efficiency factor (NEF):

$$ NEF = V_{n,rms}\sqrt{\frac{2I_{total}}{\pi \cdot V_T \cdot 4kT \cdot BW}} $$

Lower NEF = more noise-efficient use of power/area.

Topology Considerations
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Single-Ended vs Differential
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AspectSingle-EndedDifferential
Area
NoiseBaseline\(\sqrt{2}\)× worse
CMRRPoorExcellent
PSRRPoorGood

Differential adds noise but improves other metrics.

Cascaded Stages
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       ┌──────┐     ┌──────┐     ┌──────┐
Vin ──▶│ A1   │────▶│ A2   │────▶│ A3   │──▶ Vout
       │ (big)│     │      │     │      │
       └──────┘     └──────┘     └──────┘
    Make this large for low noise

Noise contribution of stage n:

$$ \text{Contribution}_n = \frac{\overline{v_n^2}}{\prod_{i=1}^{n-1} A_i^2} $$

Area Optimization Techniques
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1. Use Minimum Size Where Noise Isn’t Critical
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LocationSize Strategy
Input stageLarge (noise-critical)
Current mirrorsMedium
Load devicesMinimum
Digital circuitsMinimum

2. Chopper Stabilization
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Modulate signal above 1/f corner:

     ┌───────┐      ┌───────┐      ┌───────┐
Vin─▶│ Chop  │─────▶│ Amp   │─────▶│ Chop  │─▶Vout
     │ (fc)  │      │       │      │ (fc)  │
     └───────┘      └───────┘      └───────┘

Benefit: Eliminates 1/f noise without larger area.

3. Correlated Double Sampling (CDS)
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For discrete-time systems:

$$ V_{out} = (V_{sig} + V_n(t_2)) - V_n(t_1) $$

If \(t_2 - t_1\) is small, noise cancels.

4. Averaging
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Parallel devices reduce uncorrelated noise:

$$ \overline{v_n^2}_{parallel} = \frac{\overline{v_n^2}}{N} $$

Cost: N× area, N× power.

Practical Design Flow
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Step 1: Determine Noise Budget
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$$ SNR_{required} = \frac{V_{signal,rms}}{V_{noise,rms}} $$

Step 2: Allocate Noise to Stages
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$$ V_{n,total}^2 = V_{n,stage1}^2 + V_{n,stage2}^2 + ... $$

Typically: Stage 1 gets 70% of noise budget.

Step 3: Size for Noise Target
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$$ W = \frac{4kT\gamma}{g_m \cdot \overline{v_{n,target}^2} / \Delta f} $$

Step 4: Verify Area Constraints
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If area too large:

  • Reduce bandwidth
  • Use chopping/CDS
  • Relax noise specification

Summary
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Key insights on area-noise trade-off:

  1. Thermal noise: \(\propto 1/\sqrt{W}\)
  2. Flicker noise: \(\propto 1/\sqrt{WL}\)
  3. First stage: Dominates total noise
  4. Chopping: Eliminates 1/f without area increase
  5. Averaging: \(N\)× area for \(N\)× noise power reduction
  6. Trade-off: To halve noise voltage, quadruple area